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Analytical validation of the Young–Dupré law for epitaxially-strained thin films - MaRDI portal

Analytical validation of the Young–Dupré law for epitaxially-strained thin films (Q4973274)

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scientific article; zbMATH DE number 7139218
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English
Analytical validation of the Young–Dupré law for epitaxially-strained thin films
scientific article; zbMATH DE number 7139218

    Statements

    Analytical validation of the Young–Dupré law for epitaxially-strained thin films (English)
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    3 December 2019
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    Young-Dupré
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    contact angle
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    wetting
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    triple junctions
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    thin films
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    sharp-interface model
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    transmission problems
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