TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS (Q5305786)
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scientific article; zbMATH DE number 5686244
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS |
scientific article; zbMATH DE number 5686244 |
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TEST: Testing Environment for Embedded Systems Based on TTCN-3 in SILS (English)
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23 March 2010
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testing environment
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TTCN-3 testing system
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embedded system software
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