Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing (Q5481633)
From MaRDI portal
| This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing |
scientific article; zbMATH DE number 5044983
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing |
scientific article; zbMATH DE number 5044983 |
Statements
Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing (English)
0 references
10 August 2006
0 references
bagging
0 references
change-point analysis
0 references
Markov chain Monte Carlo
0 references
optimal segmentation
0 references
quality control
0 references