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Forecasting the efficiency of test generation algorithms for combinational circuits - MaRDI portal

Forecasting the efficiency of test generation algorithms for combinational circuits (Q5938663)

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scientific article; zbMATH DE number 1630194
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Forecasting the efficiency of test generation algorithms for combinational circuits
scientific article; zbMATH DE number 1630194

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    Forecasting the efficiency of test generation algorithms for combinational circuits (English)
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    1 October 2001
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    testability
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    genetic algorithm
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    forecasting
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    test generation
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