Failure probability estimation with differently sized reference products for semiconductor burn-in studies (Q6574671)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Failure probability estimation with differently sized reference products for semiconductor burn-in studies |
scientific article; zbMATH DE number 7883185
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Failure probability estimation with differently sized reference products for semiconductor burn-in studies |
scientific article; zbMATH DE number 7883185 |
Statements
Failure probability estimation with differently sized reference products for semiconductor burn-in studies (English)
0 references
18 July 2024
0 references
area scaling
0 references
binomial distribution
0 references
burn-in
0 references
combinatorics
0 references
semiconductor reliability
0 references
0 references
0 references
