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Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system - MaRDI portal

Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system (Q833941)

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scientific article; zbMATH DE number 5595587
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English
Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system
scientific article; zbMATH DE number 5595587

    Statements

    Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system (English)
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    14 August 2009
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    epitaxial film/substrate system
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    anisotropic elasticity
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    channeling crack
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    periodic array of channeling cracks
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    critical condition for crack formation
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