Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion (Q834421)
From MaRDI portal
| This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion |
scientific article; zbMATH DE number 5598485
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion |
scientific article; zbMATH DE number 5598485 |
Statements
Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion (English)
0 references
26 August 2009
0 references
ellipsoidal inclusion
0 references
eigenstrain
0 references
stress field
0 references
thin film
0 references
thickness
0 references
half-space
0 references
0 references
0 references
0 references
0.87575126
0 references
0.8752103
0 references
0 references
0.8674911
0 references
0.85928154
0 references
0.85579157
0 references
0 references
0.84914094
0 references