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Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion - MaRDI portal

Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion (Q834421)

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scientific article; zbMATH DE number 5598485
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English
Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion
scientific article; zbMATH DE number 5598485

    Statements

    Thickness effect of a thin film on the stress field due to the eigenstrain of an ellipsoidal inclusion (English)
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    26 August 2009
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    ellipsoidal inclusion
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    eigenstrain
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    stress field
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    thin film
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    thickness
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    half-space
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