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Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. I: Analysis for obtaining film stress from non-local curvature information - MaRDI portal

Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. I: Analysis for obtaining film stress from non-local curvature information (Q869280)

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scientific article; zbMATH DE number 5130262
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English
Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. I: Analysis for obtaining film stress from non-local curvature information
scientific article; zbMATH DE number 5130262

    Statements

    Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. I: Analysis for obtaining film stress from non-local curvature information (English)
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    2 March 2007
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    thin films
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    non-uniform misfit strain
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    non-uniform film thickness
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    non-local stress-curvature relations
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    interfacial shears
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