scientific article; zbMATH DE number 527269

zbMATH Open0820.68017MaRDI QIDQ4284993

Author name not available (Why is that?)

Publication date: 13 March 1994

Title of this publication is not available (Why is that?)

zbMATH Keywords

reliabilitytest patternsdefect diagnosisBIC monitorCircuits and systemsElectronic testing

Mathematics Subject Classification ID

Proceedings, conferences, collections, etc. pertaining to computer science (68-06) Computer system organization (68M99) Reliability, testing and fault tolerance of networks and computer systems (68M15)

Related Items (2)

I\(_{\text{DDT}}\): Fundamentals and test generation ⋮ Title not available (Why is that?)

This page was built for publication:

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4284993)