Fault Models and Test Methods for Subthreshold SRAMs

DOI10.1109/TC.2011.252zbMATH Open1365.94701OpenAlexW2168662569MaRDI QIDQ5274325

Chin-Yuan Huang, Hao-Yu Yang, Hung-Hsin Chen, Mango C. T. Chao, Rei-Fu Huang, Chen-Wei Lin

Publication date: 12 July 2017

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.2011.252

Mathematics Subject Classification ID

Applications of graph theory to circuits and networks (94C15)

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