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A Monte Carlo percolative approach to reliability analysis of semiconductor structures

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Publication:5938382
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DOI10.1016/S0378-4754(00)00266-4zbMATH Open1114.82316WikidataQ126339564 ScholiaQ126339564MaRDI QIDQ5938382

Gy. Trefán, L. Reggiani, C. Pennetta

Publication date: 18 July 2001

Published in: Mathematics and Computers in Simulation (Search for Journal in Brave)




zbMATH Keywords

Joule heatingIntegrated circuitsMonte Carlo percolative approach


Mathematics Subject Classification ID

Statistical mechanics of semiconductors (82D37)



Related Items (2)

Probabilistic failure mechanisms via Monte Carlo simulations of complex microstructures ⋮ Use of contagious distributions in the semiconductor yield models considering cluster effect






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