Nonparametric permutation and combination-based multivariate control charts with applications in microelectronics

DOI10.1002/ASMB.1976MaRDI QIDQ6570836

Livio Corain, Luigi Salmaso

Publication date: 10 July 2024

Published in: Applied Stochastic Models in Business and Industry (Search for Journal in Brave)

zbMATH Keywords

finite-sample consistencymultivariate testsnonparametric combinationNPC chart

Mathematics Subject Classification ID

Statistics (62-XX)

Cites Work

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• Multiple aspect testing for case-control designs
• A bi-aspect nonparametric test for the two-sample location problem
• A bi-aspect nonparametric test for the multi-sample location problem
• Permutation tests for stochastic ordering and ANOVA. Theory and applications with \(\mathtt R\)
• Simulating multivariate nonnormal distributions
• Finite-sample consistency of combination-based permutation tests with application to repeated measures designs
• Multivariate Generalizations of Cumulative Sum Quality-Control Schemes
• A Multivariate Exponentially Weighted Moving Average Control Chart
• Power of the Noncentral F-Test: Effect of Additional Variates on Hotelling's T 2 -Test
• Multivariate Bi-Aspect Testing for the Two-Sample Location Problem
• Multivariate tri-aspect non-parametric testing
• The Large-Sample Power of Tests Based on Permutations of Observations

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