Modeling and analyzing semiconductor yield with generalized linear mixed models

DOI10.1002/ASMB.2074MaRDI QIDQ6571878

Douglas C. Montgomery, D. C. Krueger

Publication date: 12 July 2024

Published in: Applied Stochastic Models in Business and Industry (Search for Journal in Brave)

zbMATH Keywords

GLMgeneralized linear mixed modelsgeneralized linear modelsbig dataGLMMsemiconductor yield modeling

Mathematics Subject Classification ID

Statistics (62-XX)

Cites Work

• Title not available (Why is that?)
• Title not available (Why is that?)
• Title not available (Why is that?)
• Title not available (Why is that?)
• Generalized linear mixed models: a review and some extensions
• Monitoring Wafer Map Data from Integrated Circuit Fabrication Processes for Spatially Clustered Defects
• Approximate Inference in Generalized Linear Mixed Models
• Generalized linear mixed models a pseudo-likelihood approach
• A review of yield modelling techniques for semiconductor manufacturing
• Validation and evaluation for defect-kill-rate and yield estimation models in semiconductor manufacturing
• Statistics for microelectronics
• Nonparametric permutation and combination-based multivariate control charts with applications in microelectronics
• Determining the target value of ACICD to optimize the electrical characteristics of semiconductors using dual response surface optimization
• Mixed response surface models and Bayesian analysis of variance components for electrically conductive adhesives

This page was built for publication: Modeling and analyzing semiconductor yield with generalized linear mixed models

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q6571878)