Pages that link to "Item:Q1101089"
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The following pages link to A systematic technique for detecting and locating bridging and stuck-at faults in I/O pins of LSI/VLSI chips (Q1101089):
Displaying 3 items.
- Detection of multiple input bridging and stuck-on faults in CMOS logic circuits using current monitoring (Q757021) (← links)
- BIST design for detecting multiple stuck-open faults in CMOS circuits using transition count (Q1433981) (← links)
- Stuck-At Fault Tests in the Presence of Undetectable Bridging Faults (Q3331145) (← links)