Pages that link to "Item:Q2458124"
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The following pages link to The inverse problem of estimating the film structure from X-ray reflection data (Q2458124):
Displaying 4 items.
- Stochastic algorithms for solving linear and nonlinear inverse ill-posed problems for particle size retrieving and x-ray diffraction analysis of epitaxial films (Q896612) (← links)
- Parameter detection of thin films from their X-ray reflectivity by support vector machines. (Q1427212) (← links)
- Direct and inverse problems of studying the properties of multilayer nanostructures based on a two-dimensional model of X-ray reflection and scattering (Q2940498) (← links)
- (Q4357676) (← links)