Pages that link to "Item:Q2720911"
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The following pages link to Test generation of the digital circuits based on the genetic algorithms (Q2720911):
Displaying 6 items.
- A parallel system for test pattern generation (Q1208514) (← links)
- Genetic algorithms for the synthesis optimization of a set of irredundant diagnostic tests in the intelligent system. (Q1566124) (← links)
- DNA and quantum based algorithms for VLSI circuits testing (Q2575322) (← links)
- A neural network algorithm for digital circuits test generation (Q2775955) (← links)
- A New and Fast Approach to Very Large Scale Integrated Sequential Circuit Test Generation (Q4384085) (← links)
- DNA computing approach for automated test pattern generation for digital circuits (Q5402738) (← links)