A neural network algorithm for digital circuits test generation (Q2775955)
From MaRDI portal
| This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: A neural network algorithm for digital circuits test generation |
scientific article; zbMATH DE number 1714242
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A neural network algorithm for digital circuits test generation |
scientific article; zbMATH DE number 1714242 |
Statements
15 December 2002
0 references
automatic test pattern generation
0 references
0.9192359
0 references
0 references
0.85984266
0 references
0.8510729
0 references
A neural network algorithm for digital circuits test generation (English)
0 references