Pages that link to "Item:Q3122556"
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The following pages link to On the testability of iterative logic arrays (Q3122556):
Displaying 11 items.
- Methods of testability analysis for digital logic (Q584226) (← links)
- Testable design of AND-EXOR logic networks with universal test sets (Q733292) (← links)
- Complete checking of programmable logic arrays. I (Q761421) (← links)
- Testing in two-dimensional iterative logic arrays (Q1101079) (← links)
- On GID-testable two-dimensional iterative arrays (Q1322383) (← links)
- Maximum ease of testability of logic circuits with respect to multiple stuck-on faults (Q1816073) (← links)
- (Q3435076) (← links)
- (Q3739059) (← links)
- MODIFIED TRANSITION MATRIX AND FAULT TESTING IN SEQUENTIAL LOGIC CIRCUITS UNDER RANDOM STIMULI WITH A SPECIFIED MEASURE OF CONFIDENCE (Q3741577) (← links)
- A design of programmable logic arrays with universal tests (Q3912733) (← links)
- Test generation for iterative logic arrays based on an N-cube of cell states model (Q5375418) (← links)