Testable design of AND-EXOR logic networks with universal test sets (Q733292)
From MaRDI portal
| This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Testable design of AND-EXOR logic networks with universal test sets |
scientific article; zbMATH DE number 5615614
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Testable design of AND-EXOR logic networks with universal test sets |
scientific article; zbMATH DE number 5615614 |
Statements
Testable design of AND-EXOR logic networks with universal test sets (English)
0 references
15 October 2009
0 references
design-for-testability
0 references
GRM/ESOP network
0 references
stuck-at and bridging faults
0 references
BIST
0 references
universal test set
0 references
0.88409257
0 references
0.8748857
0 references
0.86984116
0 references
0 references
0.85593784
0 references
0.8559032
0 references
0.85240215
0 references
0.85228765
0 references