Pages that link to "Item:Q4303906"

The following pages link to Design of easily testable combinational circuits (Q4303906):

Displaying 19 items.

• Functional diagnosis of combinational circuits by compact testing methods (Q751633) (← links)
• Design of easily testable discrete devices: Ideas, methods, implementation (Q801801) (← links)
• Partitioning circuits for improved testability (Q920939) (← links)
• Constructing self-testing circuits with the use of step-by-step (cascade) control (Q1040503) (← links)
• Method of synthesis of easily tested circuits (Q1105569) (← links)
• Checking combinational circuits by means of functional indices (Q1249556) (← links)
• Construction of code-disjoint self-parity combinational circuits for self-testing and functional diagnosis (Q1287555) (← links)
• Testable circuit design for ring testing (Q1316286) (← links)
• Improving estimates of parameters and shortening the procedure for constructing efficient diagnostic polynomials. (Q1389291) (← links)
• A method of synthesis of irredundant circuits admitting single fault detection tests of constant length (Q1741482) (← links)
• Easily testable realization of a circuit on the basis of polynomial representation of output functions (Q1778381) (← links)
• Logic complement, a new method of checking the combinational circuits (Q1778833) (← links)
• Synthesizing testable combinational circuits (Q1882093) (← links)
• Detection of faults in combinational circuits by a self-dual test (Q1883839) (← links)
• Easily tested circuits for linear functions (Q2513230) (← links)
• Checking combinational circuits by the method of logic complement (Q2577216) (← links)
• Optimal design of hazard-free and easily testable logic networks (Q3680758) (← links)
• (Q3696841) (← links)
• (Q3760446) (← links)