Pages that link to "Item:Q609817"
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The following pages link to Scheduling algorithms for a semiconductor probing facility (Q609817):
Displaying 12 items.
- Scheduling semiconductor multihead testers using metaheuristic techniques embedded with lot-specific and configuration-specific information (Q473662) (← links)
- Hybrid decomposition heuristics for solving large-scale scheduling problems in semiconductor wafer fabrication (Q880579) (← links)
- Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing (Q1011272) (← links)
- Job scheduling of diffusion furnaces in semiconductor fabrication facilities (Q2140148) (← links)
- A novel timetabling algorithm for a furnace process for semiconductor fabrication with constrained waiting and frequency-based setups (Q2642312) (← links)
- Scheduling of bottleneck workstation in wafer fabrication systems based on an improved multi-objective particle swarm optimization algorithm (Q2923639) (← links)
- A new paradigm for rule-based scheduling in the wafer probe centre (Q3518508) (← links)
- The wafer probing scheduling problem (WPSP) (Q4656694) (← links)
- Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions (Q4681718) (← links)
- Scheduling of multiple in-line steppers for semiconductor wafer fabs (Q5172568) (← links)
- Solution strategies for multi-stage wafer probing scheduling problem with reentry (Q5387401) (← links)
- A simulation optimization framework to solve stochastic flexible job-shop scheduling problems -- case: semiconductor manufacturing (Q6551110) (← links)
