Pages that link to "Item:Q833902"
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The following pages link to Failure of microelectromechanical systems subjected to impulse loads (Q833902):
Displaying 7 items.
- Mechanics of energy transfer and failure of ductile microscale beams subjected to dynamic loading (Q443626) (← links)
- Dynamic delamination of patterned thin films: a numerical study (Q989726) (← links)
- A three-scale FE approach to reliability analysis of MEMS sensors subject to impacts (Q1027930) (← links)
- Stress-driven morphological instability and catastrophic failure of microdevices. (Q1395543) (← links)
- Predictions of strength in MEMS components with defects --- a novel experimental--theoretical approach (Q1777193) (← links)
- Monte Carlo simulation of micro-cracking in polysilicon MEMS exposed to shocks (Q2439195) (← links)
- Dynamic response of electronic materials to impact loading: review (Q6066695) (← links)