Pages that link to "Item:Q2459883"
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The following pages link to An analysis of the membrane deflection experiment used in the investigation of mechanical properties of freestanding submicron thin films (Q2459883):
Displaying 5 items.
- An atomistic-based finite deformation membrane for single layer crystalline films (Q700968) (← links)
- SEM in-situ investigation on failure of nanometallic film/substrate structures under three-point bending loading (Q1028762) (← links)
- Micromechanics of substrate-supported thin films (Q1639762) (← links)
- Predictions of strength in MEMS components with defects --- a novel experimental--theoretical approach (Q1777193) (← links)
- Modeling of elastoplastic behavior of freestanding square thin films under bulge testing (Q2234561) (← links)