Functional test generation using binary decision diagrams (Q1101072)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Functional test generation using binary decision diagrams |
scientific article; zbMATH DE number 4045657
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Functional test generation using binary decision diagrams |
scientific article; zbMATH DE number 4045657 |
Statements
Functional test generation using binary decision diagrams (English)
0 references
1987
0 references
fault detection
0 references
extension to the D-algorithm
0 references
integrated circuits
0 references
binary decision diagrams
0 references
LSI/VLSI circuit
0 references
network of interconnected modules
0 references
