I\(_{\text{DDT}}\): Fundamentals and test generation (Q1415925)
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scientific article; zbMATH DE number 2015235
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | I\(_{\text{DDT}}\): Fundamentals and test generation |
scientific article; zbMATH DE number 2015235 |
Statements
I\(_{\text{DDT}}\): Fundamentals and test generation (English)
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9 December 2003
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\(I_{\text{DDT}}\) testing
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logical transition
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average transient current
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0.88372433
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