Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits (Q1873059)
From MaRDI portal
 | This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits |
scientific article; zbMATH DE number 1912350
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits |
scientific article; zbMATH DE number 1912350 |
Statements
Application of the simulated annealing local search technique to problems of redundancy elimination in functional and parametric tests of integrated circuits (English)
0 references
19 May 2003
0 references
The authors investigate combinatorial optimization problems reducing subset of tests of integrated circuits, which are redundant in a statistical sense. These problems are solved, using a simulated annealing local search technique. An example is given.
0 references
numerical example
0 references
redundancy elimination
0 references
integrated circuits
0 references
test cost reduction
0 references
simulated annealing
0 references
combinatorial optimization
0 references
0.82827526
0 references
