Model-based clustering for integrated circuit yield enhancement (Q857371)
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scientific article; zbMATH DE number 5080347
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Model-based clustering for integrated circuit yield enhancement |
scientific article; zbMATH DE number 5080347 |
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Model-based clustering for integrated circuit yield enhancement (English)
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14 December 2006
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quality control
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stochastic processes
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