scientific article; zbMATH DE number 750121

zbMATH Open0837.94002MaRDI QIDQ4764191

Author name not available (Why is that?)

Publication date: 2 May 1995

Title of this publication is not available (Why is that?)

zbMATH Keywords

approximation methodsorthogonal arraysVLSIgradient estimationfactor screeningcomplex objectsstatistical circuit designvariability minimizationIC designersmulti-objective circuit optimizationparametric yield maximization

Mathematics Subject Classification ID

Design of statistical experiments (62K99) Research exposition (monographs, survey articles) pertaining to information and communication theory (94-02) Applications of design theory to circuits and networks (94C30)

Related Items (4)

Modeling Yield, Cost, and Quality of a Spare-Enhanced Multicore Chip ⋮ Burn-in considering yield loss and reliability gain for integrated circuits ⋮ Title not available (Why is that?) ⋮ Optimization of manufacturing of emitter-coupled logic to decrease surface of chip

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