Pages that link to "Item:Q1101421"
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The following pages link to An algorithm to generate complete test sets for stuck-at faults in combinational logic circuits (Q1101421):
Displaying 7 items.
- Design of exclusive or sum-of-products (ESP) logic arrays with universal tests for detecting stuck-at and bridging faults (Q792959) (← links)
- A generalized fault simulator for combinational logic circuits (Q805218) (← links)
- Complete test-set generation for bridging faults in combinational-logic circuits (Q1077377) (← links)
- An algorithm for stuck-at fault coverage analysis of combinational and sequential logic circuits (Q1117203) (← links)
- Maximum ease of testability of logic circuits with respect to multiple stuck-on faults (Q1816073) (← links)
- (Q3751514) (← links)
- (Q3869272) (← links)