Pages that link to "Item:Q2720921"
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The following pages link to Structural approach to functional faults testing in discrete devices (Q2720921):
Displaying 8 items.
- Decomposition of discrete devices for testable transformation (Q378373) (← links)
- Development of a multiple intermittent fault testing strategy (Q788700) (← links)
- Design of easily testable discrete devices: Ideas, methods, implementation (Q801801) (← links)
- Method for segregation of suspected logical malfunctions in combinatorial discrete devices (Q1003090) (← links)
- Path testing in circuits with functional units (Q1095869) (← links)
- Functional testing based on unified structural redundancy (Q1320869) (← links)
- FsmTest: Functional test generation for sequential circuits (Q4332021) (← links)
- New Design for Testability Approach for Clock Fault Testing (Q5277620) (← links)