Pages that link to "Item:Q2439195"
From MaRDI portal
The following pages link to Monte Carlo simulation of micro-cracking in polysilicon MEMS exposed to shocks (Q2439195):
Displaying 9 items.
- Multiscale modelling framework for the fracture of thin brittle polycrystalline films: application to polysilicon (Q487915) (← links)
- Failure of microelectromechanical systems subjected to impulse loads (Q833902) (← links)
- On-chip electrostatically actuated bending tests for the mechanical characterization of polysilicon at the micro scale (Q865134) (← links)
- A three-scale FE approach to reliability analysis of MEMS sensors subject to impacts (Q1027930) (← links)
- Fracture of solar-grade anisotropic polycrystalline silicon: a combined phase field-cohesive zone model approach (Q2310198) (← links)
- A stochastic multi-scale approach for the modeling of thermo-elastic damping in micro-resonators (Q2310344) (← links)
- Monte Carlo simulation of micro-cracking in polysilicon MEMS exposed to shocks (Q2439195) (← links)
- A Monte Carlo percolative approach to reliability analysis of semiconductor structures (Q5938382) (← links)
- Propagation of material and surface profile uncertainties on MEMS micro-resonators using a stochastic second-order computational multi-scale approach (Q6557349) (← links)