Pages that link to "Item:Q850043"
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The following pages link to A microbeam bending method for studying stress-strain relations for metal thin films on silicon substrates (Q850043):
Displaying 8 items.
- Bauschinger and size effects in thin-film plasticity due to defect-energy of geometrical necessary dislocations (Q362872) (← links)
- On-chip electrostatically actuated bending tests for the mechanical characterization of polysilicon at the micro scale (Q865134) (← links)
- SEM in-situ investigation on failure of nanometallic film/substrate structures under three-point bending loading (Q1028762) (← links)
- Nonlinear electro-dynamic analysis of micro-actuators: effect of material nonlinearity (Q1630714) (← links)
- Modeling of elastoplastic behavior of freestanding square thin films under bulge testing (Q2234561) (← links)
- Dynamic analysis of size-dependent micro-beams with nonlinear elasticity under electrical actuation (Q2284866) (← links)
- Plastic deformation of freestanding thin films: experiments and modeling (Q2456945) (← links)
- An analysis of the membrane deflection experiment used in the investigation of mechanical properties of freestanding submicron thin films (Q2459883) (← links)
