3D-measurement using a scanning electron microscope (Q603088)
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scientific article; zbMATH DE number 5810990
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | 3D-measurement using a scanning electron microscope |
scientific article; zbMATH DE number 5810990 |
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3D-measurement using a scanning electron microscope (English)
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5 November 2010
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scanning electron microscope
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photometric method
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shape from shading
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secondary electrons
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backscattered electrons
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0.85552466
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0.84687114
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0.81029135
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