Pages that link to "Item:Q869280"
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The following pages link to Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. I: Analysis for obtaining film stress from non-local curvature information (Q869280):
Displaying 10 items.
- Asymptotic analysis of an adhesive joint with mismatch strain (Q335126) (← links)
- Non-uniform, axisymmetric misfit strain in thin films bonded on plate substrates/substrate systems: the relation between non-uniform film stresses and system curvatures (Q608625) (← links)
- Multi-layer thin films/substrate system subjected to non-uniform misfit strains (Q837355) (← links)
- A microbeam bending method for studying stress-strain relations for metal thin films on silicon substrates (Q850043) (← links)
- Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. II: Experimental validation of the non-local stress/curvature relations (Q869281) (← links)
- Analysis of film strain and stress in a film-substrate cantilever system (Q948543) (← links)
- Extension of Stoney's formula to non-uniform temperature distributions in thin film/substrate systems. The case of radial symmetry (Q1019350) (← links)
- Substrate curvature due to thin film mismatch strain in the nonlinear deformation range (Q1976950) (← links)
- Residual stresses in silicon-on-sapphire thin film systems (Q2428387) (← links)
- The role of the sample shape and size on the internal stress induced curvature of thin-film substrate systems (Q2567373) (← links)
